From ef1c170abd1809a30104d162f403c13e5d3caf10 Mon Sep 17 00:00:00 2001 From: Kevin Abraham Date: Mon, 27 Oct 2025 15:20:37 +0000 Subject: [PATCH] Revert "added grouped_conv_bilinear to tests" This reverts commit fb30b087d6402a34f08cc1ee772a81df632e39d5. --- experimental/builder/test/CMakeLists.txt | 1 - ...y_grouped_convolution_forward_bilinear.cpp | 118 ------------------ 2 files changed, 119 deletions(-) delete mode 100644 experimental/builder/test/test_ck_factory_grouped_convolution_forward_bilinear.cpp diff --git a/experimental/builder/test/CMakeLists.txt b/experimental/builder/test/CMakeLists.txt index f8974c24da..f586eade21 100644 --- a/experimental/builder/test/CMakeLists.txt +++ b/experimental/builder/test/CMakeLists.txt @@ -33,7 +33,6 @@ endfunction() add_ck_factory_test(test_testing_utils test_testing_utils.cpp) add_ck_factory_test(test_ck_factory_grouped_convolution_forward test_ck_factory_grouped_convolution_forward.cpp) -add_ck_factory_test(test_ck_factory_grouped_convolution_forward_bilinear test_ck_factory_grouped_convolution_forward_bilinear.cpp) add_ck_factory_test(test_ck_factory_grouped_convolution_forward_convscale test_ck_factory_grouped_convolution_forward_convscale.cpp) add_ck_factory_test(test_ck_factory_grouped_convolution_forward_dynamic_op test_ck_factory_grouped_convolution_forward_dynamic_op.cpp) add_ck_factory_test(test_ck_factory_grouped_convolution_forward_scale test_ck_factory_grouped_convolution_forward_scale.cpp) diff --git a/experimental/builder/test/test_ck_factory_grouped_convolution_forward_bilinear.cpp b/experimental/builder/test/test_ck_factory_grouped_convolution_forward_bilinear.cpp deleted file mode 100644 index cc9cbd3dda..0000000000 --- a/experimental/builder/test/test_ck_factory_grouped_convolution_forward_bilinear.cpp +++ /dev/null @@ -1,118 +0,0 @@ -// SPDX-License-Identifier: MIT -// Copyright (c) 2025, Advanced Micro Devices, Inc. All rights reserved. - -#include -#include "ck/utility/data_type.hpp" -#include "testing_utils.hpp" - -using ck_tile::test::InstanceSet; -using ck_tile::test::InstancesMatch; - -namespace { - -constexpr static auto NumDimSpatial = 3; -using InLayout = ck::tensor_layout::convolution::NDHWGC; -using WeiLayout = ck::tensor_layout::convolution::GKZYXC; -using OutLayout = ck::tensor_layout::convolution::NDHWGK; -using DsLayout = ck::Tuple; - -using ck::tensor_operation::device::DeviceGroupedConvFwdMultipleABD; -using ck::tensor_operation::element_wise::Bilinear; -using ck::tensor_operation::element_wise::PassThrough; - -template -using DeviceOp = DeviceGroupedConvFwdMultipleABD, - type, // OutDataType - PassThrough, - PassThrough, - Bilinear, - computeType, - computeType>; - -} // namespace - -template -struct CkFactoryTestBilinearFwd : public testing::Test -{ - static auto get_actual_instances() - { - return InstanceSet::from_factory(); - } - - static auto get_expected_instances() { return InstanceSet(Case::expected); } -}; - -struct Bilinear_F32 -{ - using DeviceOp = ::DeviceOp; - - constexpr static auto expected = { - // clang-format off - "" - // clang-format on - }; -}; - -struct Bilinear_F32_TF32 -{ - using DeviceOp = ::DeviceOp; - - constexpr static auto expected = { - // clang-format off - "" - // clang-format on - }; -}; - -struct Bilinear_F16 -{ - using DeviceOp = ::DeviceOp; - - constexpr static auto expected = { - // clang-format off - "" - // clang-format on - }; -}; - -struct Bilinear_BF16 -{ - using DeviceOp = ::DeviceOp; - - constexpr static auto expected = { - // clang-format off - "" - // clang-format on - }; -}; - -struct Bilinear_INT8 -{ - using DeviceOp = ::DeviceOp; - - constexpr static auto expected = { - // clang-format off - "" - // clang-format on - }; -}; - -using TestTypes = - ::testing::Types; - -TYPED_TEST_SUITE(CkFactoryTestBilinearFwd, TestTypes); - -TYPED_TEST(CkFactoryTestBilinearFwd, TestInstances) -{ - auto actual = TestFixture::get_actual_instances(); - auto expected = TestFixture::get_expected_instances(); - - EXPECT_THAT(actual, InstancesMatch(expected)); -}