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* Few small fixes. * New GroupedGemm instances (BF16) * Unify and refactor GroupedGEMM device API. * Adapt changes to new API. * Adapt grouped gemm profiler. * Accept multiple kbatches for grouped gemm profiler. - delete obsolete two stage as it is now covered by grouped gemm * Update unit test for grouped gemm. * Fix thresholds for BF16 and F8. Unblock tests. * Fix few instances. * Multiple small fixes. * Adapt to new API, check dynamic casting. * Uncomment few data types in grouped gemm profiler. * Fix call to SetDeviceArgs. * Fix profile grouped gemm multiply tile loop. * Fix grouped gemm tile loop kernel args in client examples. * Review comments.
45 lines
1.3 KiB
C++
45 lines
1.3 KiB
C++
// SPDX-License-Identifier: MIT
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// Copyright (c) 2018-2024, Advanced Micro Devices, Inc. All rights reserved.
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#include <tuple>
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#include <vector>
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#include "ck/tensor_operation/gpu/device/tensor_layout.hpp"
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#include "ck/utility/data_type.hpp"
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#include "gtest/gtest.h"
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#include "test_grouped_gemm_util.hpp"
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using F16 = ck::half_t;
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using BF16 = ck::bhalf_t;
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using F8 = ck::f8_t;
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using I8 = int8_t;
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using Row = ck::tensor_layout::gemm::RowMajor;
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using Col = ck::tensor_layout::gemm::ColumnMajor;
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template <typename Tuple>
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class TestGroupedGemm : public ck::test::TestGroupedGemm<Tuple>
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{
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};
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// clang-format off
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using KernelTypes = ::testing::Types<
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std::tuple< Row, Row, Row, F16, F16, F16>,
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std::tuple< Row, Col, Row, F16, F16, F16>,
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std::tuple< Col, Row, Row, F16, F16, F16>,
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std::tuple< Col, Col, Row, F16, F16, F16>,
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std::tuple< Row, Row, Row, BF16, BF16, BF16>,
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std::tuple< Row, Col, Row, BF16, BF16, BF16>,
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std::tuple< Col, Row, Row, BF16, BF16, BF16>,
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std::tuple< Row, Row, Row, BF16, I8, BF16>,
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std::tuple< Row, Col, Row, BF16, I8, BF16>,
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std::tuple< Row, Row, Row, F16, F8, F16>,
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std::tuple< Row, Row, Row, F8, F16, F16>
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>;
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// clang-format on
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TYPED_TEST_SUITE(TestGroupedGemm, KernelTypes);
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#include "test_grouped_gemm_ut_cases.inc"
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