reduce test size to avoid timeout on specific silicon (#1966)

[ROCm/composable_kernel commit: ba209b9dab]
This commit is contained in:
Haocong WANG
2025-03-12 00:15:26 +08:00
committed by GitHub
parent 8fe2095d43
commit 1f5c6f2db1

View File

@@ -102,7 +102,6 @@ TYPED_TEST(TestBatchedGemmMaskingScaleSoftmaxGemmPermuteBF16, Bench_BF16_Irregul
{256, 64, 160, 64, 1, 16},
{1024, 1024, 80, 80, 1, 16},
{1024, 64, 80, 64, 1, 16},
{4096, 4096, 40, 40, 1, 16},
{4096, 64, 40, 64, 1, 16}};
this->bench_ = true;
this->verify_ = false;
@@ -118,10 +117,6 @@ TYPED_TEST(TestBatchedGemmMaskingScaleSoftmaxGemmPermuteBF16, Bench_BF16)
{512, 512, 128, 128, 48, 16},
{1024, 1024, 64, 64, 48, 16},
{1024, 1024, 128, 128, 48, 16},
{2048, 2048, 64, 64, 48, 16},
{2048, 2048, 128, 128, 48, 16},
{4096, 4096, 64, 64, 48, 16},
{4096, 4096, 128, 128, 48, 16},
};
this->bench_ = true;
this->verify_ = false;