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* feat: test setup for batched contraction (aka batched gemm multiple d e permute)
* wip: device struct for WMMA batched contraction multiple d based on new gridwise op
* feat: working batched contraction on RDNA, non-naive tensor descriptors for gridwise_gemm_wmma_cshuffle_v3, test setup for odd cases
* fix: failure to resolve template parameters when calling new function overload
* fix: passing reference type as parameter instead of underlying types
* fix: merge error caused duplicate definitions
* fix: make sure constness of template and parameters types match
* fix: don't compile batched contraction test on unsupported architectures
* feat: add example for new wmma implementation, and consolidate example code between platforms
* style: return inline instead of with branch
* chore: add extra assert on vector memory access sizes
* chore: clean up some unused variables
* fix: correct tail number calculation, added small cases and extra instances to the test
* fix: properly support wave transfer by generating correct grid descriptors dependent on the transfer method
[ROCm/composable_kernel commit: fe40a5d139]
9 lines
359 B
CMake
9 lines
359 B
CMake
# Copyright (c) Advanced Micro Devices, Inc., or its affiliates.
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# SPDX-License-Identifier: MIT
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if (CK_USE_XDL OR CK_USE_WMMA)
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add_gtest_executable(test_batched_contraction test_batched_contraction.cpp)
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if(result EQUAL 0)
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target_link_libraries(test_batched_contraction PRIVATE utility device_batched_gemm_bias_permute_instance)
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endif()
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endif() |